JPS6196378U - - Google Patents
Info
- Publication number
- JPS6196378U JPS6196378U JP18136284U JP18136284U JPS6196378U JP S6196378 U JPS6196378 U JP S6196378U JP 18136284 U JP18136284 U JP 18136284U JP 18136284 U JP18136284 U JP 18136284U JP S6196378 U JPS6196378 U JP S6196378U
- Authority
- JP
- Japan
- Prior art keywords
- capacitance
- capacitance measuring
- control section
- same number
- registration request
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18136284U JPS6196378U (en]) | 1984-11-29 | 1984-11-29 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18136284U JPS6196378U (en]) | 1984-11-29 | 1984-11-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6196378U true JPS6196378U (en]) | 1986-06-20 |
Family
ID=30738912
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18136284U Pending JPS6196378U (en]) | 1984-11-29 | 1984-11-29 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6196378U (en]) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5756762A (en) * | 1980-09-24 | 1982-04-05 | Kenji Machida | Impedance measuring device |
JPS58168249A (ja) * | 1982-03-30 | 1983-10-04 | Toshiba Corp | 半導体装置用試験装置 |
JPS58168247A (ja) * | 1982-03-30 | 1983-10-04 | Toshiba Corp | 選別シュ−ト装置 |
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1984
- 1984-11-29 JP JP18136284U patent/JPS6196378U/ja active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5756762A (en) * | 1980-09-24 | 1982-04-05 | Kenji Machida | Impedance measuring device |
JPS58168249A (ja) * | 1982-03-30 | 1983-10-04 | Toshiba Corp | 半導体装置用試験装置 |
JPS58168247A (ja) * | 1982-03-30 | 1983-10-04 | Toshiba Corp | 選別シュ−ト装置 |